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TLP116
TOSHIBA PHOTOCOUPLER GaAAs LED & PHOTO-IC
TLP116
PDP(Plasma Display Panel) High Speed Interface FA(Factory Automation)
The Toshiba TLP116 consists of a GaAAs light-emitting diode and an integrated high-gain, high-speed photodetector. Inverter logic (totempole output) Package type : MFSOP6 Guaranteed performance over temperature : -40~100C Power supply voltage : 4.5~5.5V Input thresholds current : IFHL=5mA(Max.) Propagation delay time (tpHL/tpLH) : 60ns(Max.) Switching speed : 20MBd(TYP.) Common mode transient immunity : 10kV/us Isolation voltage : 3750Vrms UL Recognized : UL1577,File No.E67349 TOSHIBA Weight: 0.09 g(Typ.) 11-4C2 Unit in mm
Truth Table
Input H L LED ON OFF Tr1 OFF ON Tr2 ON OFF Output L H
Pin Configuration (Top View)
1
VCC
6 5
1:ANODE 3:CATHODE 4:GND 5:VO 6:VCC
3
GND SHIELD
4
Schematic
IF 1 VF 3 Tr1
ICC 6 VCC
IO Tr2 VO 5
SHIELD
4
GND
0.1uF bypass capacitor must be connected between pins 6 and 4
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TLP116
Absolute Maximum Ratings (Ta=25C)
Characteristic
Forward current LED Forward current derating (Ta85C) (Note1) Symbol IF IF/Ta IFPT VR IO VO VCC PO Topr Tstg Tsol Rating 20 -0.5 1 5 10 6 6 40 -40~100 -55~125 260 Unit mA mA/C A V mA V V mW C C C
Peak transient forward current Reverse voltage
DETECTOR
Output current Output voltage Supply voltage Output power dissipation
Operating temperature range Storage temperature range Lead solder temperature(10s) Isolation voltage
(AC,1min.,R.H.60%,Ta=25C)
(Note2)
BVs
3750
Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Recommended Operating Conditions
Characteristic Input current , ON Input voltage , OFF Supply voltage Operating temperature (Note3) Symbol IF(ON) VF(OFF) VCC Topr Min 8 0 4.5 -40 Typ. Max 18 0.8 5.5 100 Unit mA V V C
-- --
5.0 --
Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document.
Correlation between Input current , switching speed and drive circuit (reference information).
Input current (IF) 12mA 8mA 8mA test Circuit 1 (Page 4) 1 (Page 4) 2 (Page 4,With Speed up capacitor) Typical switching speed 21 - 23 MBd 18 - 20 MBd 23 - 27 MBd
Note1 : Pulse width PW1us,300pps. Note2 : This device is regarded as a two terminal device : pins 1 and 3 are shorted together, as are pins 4,5 and 6. Note3 : The detector of this product requires a power supply voltage (VCC) of 4.5 V or higher for stable operation. If the VCC is lower than this value, an ICC may increase, or an output may be unstable. Be sure to use the product after checking the supply current, and the operation of a power-on/-off.
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TLP116
Electrical Characteristics (Unless otherwise specified, Ta=-40 to 100C,VCC=4.5~5.5V )
Characteristic Input forward voltage Temperature coefficient of forward voltage Input reverse current Input capacitance Logic low output voltage Logic high output voltage Symbol VF VF/Ta IR CT VOL VOH ICCL ICCH IFHL VFLH Test Circuit Conditions IF=10mA ,Ta=25C IF=10mA VR=5V,Ta=25C V=0,f=1MHz,Ta=25C IOL=1.6mA, IF=12mA,VCC=5V IOH=-0.02mA, VF=1.05V,VCC=5V IF=12mA VF=0V IO=1.6mA,VO<0.4V IO=-0.02mA,VO>4.0V Min. -- Typ. 1.3 -2.0 Max. 1.5 Unit V mV/C A pF V V
-- -- -- --
1 2
-- -- -- --
4.0
--
10
--
70
--
0.4
-- -- -- -- -- --
--
5.0 5.0 5
Logic low supply current Logic high supply current Input current logic low output Input voltage logic high output
3 4
-- -- --
0.8
mA mA mA V
-- --
--
*All typical values are at Ta=25C,VCC=5V,IF(ON)=12mA unless otherwise specified
Isolation Characteristics (Ta = 25C)
Characteristic Capacitance input to output Isolation resistance Symbol CS RS Test Conditions V = 0,f = 1MHz R.H. 60%,VS = 500V AC,1 minute Isolation voltage BVS AC,1 second,in oil DC,1 minute,in oil (Note 2) Min. 1x10
12
Typ. 0.8 10
14
Max.
Unit pF Vrms Vdc
(Note 2)
3750
10000 10000
Note 4:A ceramic capacitor(0.1 F) should be connected from pin 6 to pin 4 to stabilize the operation of the high gain linear amplifier. Failure to provide the bypass may impair the switching property. The total lead length between capacitor and coupler should not exceed 1 cm.
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TLP116
Switching Characteristics (Unless otherwise specified, Ta=-40 to 100C,VCC=4.5~5.5V)
Characteristic
Propagation delay time to logic high output Propagation delay time to logic low output Propagation delay time to logic high output Propagation delay time to logic low output Switching time dispersion between ON and OFF Output fall time(90-10%) Output rise time(10-90%) Common mode transient immunity at high Level output Common mode transient immunity at low level output *All typical values are at Ta=25C Note 5 : CL is approximately 15pF which includes probe and Jig/stray wiring capacitance. CML CMH 7 VCM=1000Vp-p,IF=12mA, Vo(Max)=0.4V,Ta=25C -10000 Symbol tpHL 5 tpLH tpHL 6 tpLH |tpHLtpLH| 5 IF=120mA VIN=05V (IF=08mA) VIN=50V (IF=80mA) CL=15pF (Note 5) IF=012mA IF=120mA RIN=100 CL=15pF (Note 5) Test Circuit Conditions IF=012mA RIN=100 CL=15pF (Note 5) RIN=470 CIN=27pF CL=15pF (Note 5) Min. Typ. Max. 60 60 60 60 30 Unit ns ns ns ns ns ns ns
-- -- -- -- -- -- --
-- -- -- -- --
15 15
IF=12mA , RIN=100,
-- -- --
VCM=1000Vp-p,IF=0mA, Vo(Min)=4V,Ta=25C
10000
--
V/us
--
--
V/us
TEST CIRCUIT 1 : VOL
IF
TEST CIRCUIT 2 : VOH
1
0.1uF
1 VCC
6
6 VCC 5
V
VOH
5 3 SHIELD GND 4
IOH VCC
VOL
V
IOL
VCC 3 SHIELD GND 4
0.1uF
TEST CIRCUIT 3 : ICCL
IF 1
6 VCC 5 3 SHIELD 4 ICCL
A
TEST CIRCUIT 4: ICCH
1 VCC 6 5 3 SHIELD 4 ICCH
A
VCC GND
VCC
GND
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TLP116
TEST CIRCUIT 5 : tpHL , tpLH
IF=12mA(P.G)
(f=5MHz , duty=50%)
VCC 0.1uF
50%
IF
Vo MONITORING NODE
INPUT MONITORING NODE
VCC
VO
tf
tr
90% OH
V
GND CL=15pF SHIELD RIN=100
CL=15pF 1.5V tpHL tpLH
10%
VOL
CL is capacitance of the probe and JIG. (P.G) : Pulse Generator
TEST CIRCUIT 6 : tpHL , tpLH
VIN=5V(P.G)
INPUT MONITORING NODE
(f=5MHz , duty=50%)
VCC 0.1uF
Vo MONITORING NODE
CL=15pF
50%
IF
VCC
GND SHIELD CIN=27pF RIN=470
CL=15pF
VO
tf
tr
90% OH
V
1.5V CL is capacitance of the probe and JIG. (P.G) : Pulse Generator tpHL tpLH
10%
VOL
TEST CIRCUIT 7 : Common-Mode Transient Immunity Test Circuit
90% SW A B 3 SHIELD VC SW A : IF=5mA 1000
IF
VCC
6 10% 5 GND 4 0.1uF VO VCC SW B : IF=0mA 4V 0.4V CML CMH tr tf
CM
H
=
800(V ) t r (s)
CM
L
=
800(V ) t f ( s)
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TLP116
IF-VF V F / Ta - I F
100
25C -40C 100C
-3
C o e f f i c i e n t VF/Ta(mV/C)
F o r w a r d C u r r e n t I F (mA)
-2.5 -2 -1.5 -1 -0.5 0 0.1 1 10 100
10
1
0.1 0.8
1
1.2
1.4
1.6
1.8
F o r w a r d Vo l t a g e VF(V)
F o r w a r d C u r r e n t I F (mA)
V O L - Ta
V O H - Ta
1
Logic Low Output Voltage V O L ( V )
IOL=1.6mA , IF=12mA, VCC=5V
6
Logic High Output Voltage VOH(V)
0.8 0.6 0.4 0.2 0 -40 -20 0 20
5 4 3 2 1 0 -40 -20 0 20
IOH=-0.02mA , VF=1.05V VCC=5V
40
60
80
100
40
60
80
100
Ambient Temperature Ta()
Ambient Temperature Ta()
I C C L - Ta
I C C H - Ta
10
(mA)
(mA)
IF=12mA VCC=5.5V
10
VF=0V
Logic low supply current
6 4 2 0 -40 -20 0 20 40 60 80 100
Logic High Supply Current ICCH
ICCL
8
8 6 4 2 0 -40
VCC=5.5V
-20
0
20
40
60
80
100
Ambient Temperature Ta()
Ambient Temperature Ta()
*: The above graphs show typical characteristics.
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TLP116
t p H L , t p L H - Ta t p H L , t p L H - Ta
60
(ns)
60
(ns)
tpHL
50 40
50
tpHL
Propagation delay time tPLH, tPHL
Propagation delay time tPLH, tPHL
40 30
tpLH
tpLH
30 20 10 0 -40 -20 0 20
Test Circuit 5 IF=12mA,RIN=100, CL=15pF,VCC=5.5V
20 10 0 -40 -20 0 20
Test Circuit 6 VIN=5V,RIN=470 CIN=27pF,CL=15pF,VCC=5.5V
40
60
80
100
40
60
80
100
Ambient Temperature Ta()
Ambient Temperature Ta()
tpHL,tpLH-IF
tpHL,tpLH-VCC
70
(ns)
60
(ns)
60 50 40 30 20 10 0 5 10
Test Circuit 5 RIN=100 , CL=15pF VCC=5.5V tpLH tpHL
50 40
tpHL
Propagation delay time tPLH, tPHL
Propagation delay time tPLH, tPHL
tpLH
30 20 10 0 4.5 5
Supply Voltage VCC (V)
Test Circuit 5 IF=12mA , RIN=100 CL=15pF , Ta=25C
15
20
5.5
F o r w a r d C u r r e n t I F (mA)
| t p H L - t p L H | - Ta
I F L H - Ta
30
Switching Time Dispersion between ON and OFF(ns)
Test Circuit 5 Test Circuit 6
5
(mA)
IO=1.6mA
25 20 15 10 5 0 -40 -20
4 3 2 1
VO<0.4V
Threshold input current
IFLH
0
20
40
60
80
100
0 -40 -20
0
20
40
60
80
100
Ambient Temperature Ta()
Ambient Temperature Ta()
*: The above graphs show typical characteristics.
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TLP116
RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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2007-10-01

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